IIT Bombay Postpones Mid-Semester Exams Following Students Death
IIT Bombay has postponed mid-semester exams after the tragic death of student Sahil Wakode, sparking protests and investigations.

Mumbai, September 24 (Daily Kiran) : The Indian Institute of Technology (IIT) Bombay announced on Thursday the postponement of mid-semester exams due to the tragic death of second-year student Sahil Wakode. Originally scheduled for September 26 and 27, the exams will now take place on October 10 and 11, with the timetable remaining unchanged.
Classes at the IIT Powai campus resumed on Wednesday after protests erupted following Wakode’s alleged suicide. The decision to delay the exams comes as the institution responds to the unrest within the student community.
In a show of solidarity, Rahul Gandhi, the Leader of the Opposition in the Lok Sabha, reached out to Sahil’s family by phone, offering support in their quest for justice. According to the Maharashtra Congress, Gandhi assured the family of his commitment to helping them seek accountability.
Wakode’s family has leveled serious allegations against the IIT Bombay administration and certain officials. The Mumbai Police’s Crime Branch is currently investigating the circumstances surrounding the case.
The Youth Congress plans to hold a press conference later today to outline its future strategies and actions regarding the matter. Meanwhile, the Mumbai Police stated that they are conducting a thorough investigation into Wakode’s death and urged the public to refrain from spreading misinformation.
Reports indicate that Professor Surya Narayan Dula of IIT Bombay was placed on leave following the investigation into Wakode’s death. The student’s parents are demanding Dula’s immediate arrest, citing charges of incitement to suicide and caste-based discrimination against him.
Wakode, a second-year B.Tech student in the Energy Science and Engineering department, was found hanging in his hostel room on the evening of September 18, just hours after being caught using a mobile phone during an exam.



